发明名称 Detecting sudden changes in acceleration in semiconductor device or semiconductor packaging containing semiconductor device
摘要 An approach for detecting sudden changes in acceleration in a semiconductor device or semiconductor package containing the semiconductor device is disclosed. In one embodiment, a piezoelectric sensor is embedded in a semiconductor die. The piezoelectric sensor is configured to sense a mechanical force applied to the semiconductor die. An excessive force indicator is coupled to the piezoelectric sensor. The excessive force indicator is configured to generate an excessive force indication in response to the piezoelectric sensor sensing that the mechanical force applied to the semiconductor die has exceeded a predetermined threshold indicative of an excessive mechanical force.
申请公布号 US9548275(B2) 申请公布日期 2017.01.17
申请号 US201313901108 申请日期 2013.05.23
申请人 GLOBALFOUNDRIES INC. 发明人 Ayotte Stephen P.;Pierce Benjamin J.;Sullivan Timothy M.;Truax Heather M.
分类号 H01L23/00;H01L27/20;G01P15/08;G01P15/09 主分类号 H01L23/00
代理机构 Hoffman Warnick, LLC 代理人 Cain David;Hoffman Warnick, LLC
主权项 1. A semiconductor device, comprising: a semiconductor die; a piezoelectric sensor embedded in the semiconductor die, the piezoelectric sensor configured to sense a mechanical force applied to the semiconductor die; and an excessive force indicator coupled to the piezoelectric sensor, the excessive force indicator configured to generate an excessive force indication in response to the piezoelectric sensor sensing that the mechanical force applied to the semiconductor die has exceeded a predetermined threshold indicative of an excessive mechanical force, the mechanical force due to dynamic changes in at least one of: acceleration, vibration, and mechanical shock, wherein the excessive force indicator comprises an electrochromistic material configured to change color in response to the piezoelectric sensor detecting that electrical energy corresponding to the mechanical force exceeds the predetermined threshold and a fuse configured to blow in response to the piezoelectric sensor detecting that electrical energy corresponding to the mechanical force exceeds the predetermined threshold, and wherein the semiconductor device is coupled to an electronic testing system, the electronic testing system configured to determine whether the excessive force indication indicates that the predetermined threshold has been exceeded.
地址 Grand Cayman KY
您可能感兴趣的专利