发明名称 |
Semiconductor and method of fabricating the same |
摘要 |
Provided is a semiconductor and method of manufacturing the same, and a method of forming even doping concentration of respective semiconductor device when manufacturing multiple semiconductor devices. When a concentration balance is disrupted due to an increase in doping region size, doping concentration is still controllable in example by using ion injected blocking pattern. Thus, the examples relate to a semiconductor and manufacture device with even doping, and high breakdown voltage obtainable as a result of such doping. |
申请公布号 |
US9548203(B2) |
申请公布日期 |
2017.01.17 |
申请号 |
US201514719738 |
申请日期 |
2015.05.22 |
申请人 |
Magnachip Semiconductor, Ltd. |
发明人 |
Kim Young Bae;Kim Kwang Il |
分类号 |
H01L27/148;H01L21/266;H01L29/78;H01L29/66;H01L29/08;H01L29/06 |
主分类号 |
H01L27/148 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device comprising:
a first region and a second region located on a substrate; a first semiconductor device located in the first region and having a first deep well region with a first doping concentration; a second semiconductor device located in the second region and having a second deep well region with a second doping concentration that is greater than the first doping concentration; a first body region of a first conductivity type having a third doping concentration, adjacent to the first deep well region, wherein the first doping concentration is less than the third doping concentration; and a second body region of a second conductivity type opposite to the first conductivity type located in the first body region, wherein the first deep well region has a non-planar doping profile in a horizontal direction. |
地址 |
Cheongju-si KR |