发明名称 Semiconductor and method of fabricating the same
摘要 Provided is a semiconductor and method of manufacturing the same, and a method of forming even doping concentration of respective semiconductor device when manufacturing multiple semiconductor devices. When a concentration balance is disrupted due to an increase in doping region size, doping concentration is still controllable in example by using ion injected blocking pattern. Thus, the examples relate to a semiconductor and manufacture device with even doping, and high breakdown voltage obtainable as a result of such doping.
申请公布号 US9548203(B2) 申请公布日期 2017.01.17
申请号 US201514719738 申请日期 2015.05.22
申请人 Magnachip Semiconductor, Ltd. 发明人 Kim Young Bae;Kim Kwang Il
分类号 H01L27/148;H01L21/266;H01L29/78;H01L29/66;H01L29/08;H01L29/06 主分类号 H01L27/148
代理机构 代理人
主权项 1. A semiconductor device comprising: a first region and a second region located on a substrate; a first semiconductor device located in the first region and having a first deep well region with a first doping concentration; a second semiconductor device located in the second region and having a second deep well region with a second doping concentration that is greater than the first doping concentration; a first body region of a first conductivity type having a third doping concentration, adjacent to the first deep well region, wherein the first doping concentration is less than the third doping concentration; and a second body region of a second conductivity type opposite to the first conductivity type located in the first body region, wherein the first deep well region has a non-planar doping profile in a horizontal direction.
地址 Cheongju-si KR
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