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发明名称
Defect inspection apparatus
摘要
결함 검사장치의 일 실시예는, 검사대상체를 촬영하는 촬영부; 상기 촬영부를 둘러싸도록 배치되고, 상기 검사대상체에 조광하는 조명을 포함하고, 상기 조명은 복수로 분할되어 각각 순차적으로 상기 검사대상체에 조광하고, 상기 촬영부는 상기 검사대상체에서 상기 광이 반사되는 부위를 촬영하는 것일 수 있다.
申请公布号
KR20170005600(A)
申请公布日期
2017.01.16
申请号
KR20150095839
申请日期
2015.07.06
申请人
엘지이노텍 주식회사
发明人
송광문
分类号
G01M11/02;G01N21/88;G01N21/958
主分类号
G01M11/02
代理机构
代理人
主权项
地址
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