发明名称 |
METHOD AND STRUCTURE OF FORMING CONTROLLABLE UNMERGED EPITAXIAL MATERIAL |
摘要 |
A method of forming a semiconductor device that includes forming a plurality of semiconductor pillars. A dielectric spacer is formed between at least one set of adjacent semiconductor pillars. Semiconductor material is epitaxially formed on sidewalls of the adjacent semiconductor pillars, wherein the dielectric spacer obstructs a first portion of epitaxial semiconductor material formed on a first semiconductor pillar from merging with a second portion of epitaxial semiconductor material formed on a second semiconductor pillar. |
申请公布号 |
US2017012042(A1) |
申请公布日期 |
2017.01.12 |
申请号 |
US201615157861 |
申请日期 |
2016.05.18 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION ;GLOBALFOUNDRIES INC. |
发明人 |
Cai Xiuyu;Cheng Kangguo;Khakifirooz Ali;Xie Ruilong;Yamashita Tenko |
分类号 |
H01L27/088;H01L29/06;H01L29/66;H01L29/417;H01L27/02;H01L29/78 |
主分类号 |
H01L27/088 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a plurality of fin structures; a dielectric spacer in a space between adjacent fin structures of said plurality of fin structures; and an epitaxial semiconductor present on a first sidewall of a first fin structure of the adjacent fin structures and a second sidewall of a second fin structure of the adjacent fins structures, wherein the epitaxial semiconductor material that is in contact with the first and second fin structures also contacts the dielectric spacer. |
地址 |
Armonk NY US |