发明名称 |
EMBEDDED DIE-DOWN PACKAGE-ON-PACKAGE DEVICE |
摘要 |
An apparatus including a die; and a build-up carrier including alternating layers of conductive material and dielectric material disposed on a device side of the die and dielectric material embedding a portion of a thickness dimension of the die; and a plurality of carrier contact points disposed at a gradation between the device side of the die and the embedded thickness dimension of the die and configured for connecting the carrier to a substrate. A method including disposing a die on a sacrificial substrate with a device side of the die opposite the sacrificial substrate; forming a build-up carrier adjacent a device side of a die, wherein the build-up carrier includes a dielectric material defining a gradation between the device side of the die and a backside of the die, the gradation including a plurality of carrier contact points; and separating the die and the carrier from the sacrificial substrate. |
申请公布号 |
US2017012020(A1) |
申请公布日期 |
2017.01.12 |
申请号 |
US201615273549 |
申请日期 |
2016.09.22 |
申请人 |
Intel Corporation |
发明人 |
Ooi Toong Erh;Cheah Bok Eng;Nimkar Nitesh |
分类号 |
H01L23/00;H01L21/48 |
主分类号 |
H01L23/00 |
代理机构 |
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代理人 |
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主权项 |
1. A method comprising:
disposing a die on a sacrificial substrate with a device side of the die opposite the sacrificial substrate; forming a build-up carrier adjacent a device side of a die, wherein the build-up carrier comprises
a plurality of alternating layers of conductive material and dielectric material, anddielectric material embedding a portion of a thickness dimension of the die and defining a gradation between the device side of the die and a backside of the die, the gradation comprising a plurality of carrier contact points configured for mounting the build-up carrier to the substrate; and separating the die and the build-up carrier from the sacrificial substrate. |
地址 |
Santa Clara CA US |