发明名称 EMBEDDED DIE-DOWN PACKAGE-ON-PACKAGE DEVICE
摘要 An apparatus including a die; and a build-up carrier including alternating layers of conductive material and dielectric material disposed on a device side of the die and dielectric material embedding a portion of a thickness dimension of the die; and a plurality of carrier contact points disposed at a gradation between the device side of the die and the embedded thickness dimension of the die and configured for connecting the carrier to a substrate. A method including disposing a die on a sacrificial substrate with a device side of the die opposite the sacrificial substrate; forming a build-up carrier adjacent a device side of a die, wherein the build-up carrier includes a dielectric material defining a gradation between the device side of the die and a backside of the die, the gradation including a plurality of carrier contact points; and separating the die and the carrier from the sacrificial substrate.
申请公布号 US2017012020(A1) 申请公布日期 2017.01.12
申请号 US201615273549 申请日期 2016.09.22
申请人 Intel Corporation 发明人 Ooi Toong Erh;Cheah Bok Eng;Nimkar Nitesh
分类号 H01L23/00;H01L21/48 主分类号 H01L23/00
代理机构 代理人
主权项 1. A method comprising: disposing a die on a sacrificial substrate with a device side of the die opposite the sacrificial substrate; forming a build-up carrier adjacent a device side of a die, wherein the build-up carrier comprises a plurality of alternating layers of conductive material and dielectric material, anddielectric material embedding a portion of a thickness dimension of the die and defining a gradation between the device side of the die and a backside of the die, the gradation comprising a plurality of carrier contact points configured for mounting the build-up carrier to the substrate; and separating the die and the build-up carrier from the sacrificial substrate.
地址 Santa Clara CA US