DRIVE DEVICE

摘要

The purpose of the present invention is to diagnose an abnormality detection circuit for detecting an abnormality such as an overcurrent in a power semiconductor while minimizing any increase in the number of insulating elements additionally provided. This invention is provided with a drive circuit 11 for outputting a gate signal to the power semiconductor 6, an abnormality detection circuit 12 for detecting an abnormality in the power semiconductor 6, and a diagnosis signal application circuit 14 for applying a diagnosis signal to the abnormality detection circuit 12. The diagnosis signal application circuit 14 applies the diagnosis signal on the basis of the gate signal outputted by the drive circuit.