摘要 |
A lithographic apparatus comprising an illumination system configured to condition a radiation beam, a support structure constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table constructed to hold a substrate, and a projection system configured to project the patterned radiation beam onto the substrate, the lithographic apparatus being provided with a first cooling fluid circuit which is configured to cool components to a first temperature, and provided with a second cooling fluid circuit which is configured to cool components to a second temperature that is lower than the first temperature. |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
JANSSEN, Franciscus, Johannes, Joseph;DE LA ROSETTE, Johannes, Paul, Marie;KADIJK, Edwin, Cornelis;LALLEMANT, Nicolas, Alban;LIEFOOGHE, Jan;MATTHES, Markus, Rolf, Werner;MUITJENS, Marcel, Johannus, Elisabeth, Hubertus;STEIJNS, Hubert, Matthieu, Richard;VAN DE VELDE, André, Gillis;VAN DEN BRINK, Marinus, Aart |