发明名称 LITHOGRAPHIC APPARATUS
摘要 A lithographic apparatus comprising an illumination system configured to condition a radiation beam, a support structure constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam, a substrate table constructed to hold a substrate, and a projection system configured to project the patterned radiation beam onto the substrate, the lithographic apparatus being provided with a first cooling fluid circuit which is configured to cool components to a first temperature, and provided with a second cooling fluid circuit which is configured to cool components to a second temperature that is lower than the first temperature.
申请公布号 WO2017005463(A1) 申请公布日期 2017.01.12
申请号 WO2016EP63621 申请日期 2016.06.14
申请人 ASML NETHERLANDS B.V. 发明人 JANSSEN, Franciscus, Johannes, Joseph;DE LA ROSETTE, Johannes, Paul, Marie;KADIJK, Edwin, Cornelis;LALLEMANT, Nicolas, Alban;LIEFOOGHE, Jan;MATTHES, Markus, Rolf, Werner;MUITJENS, Marcel, Johannus, Elisabeth, Hubertus;STEIJNS, Hubert, Matthieu, Richard;VAN DE VELDE, André, Gillis;VAN DEN BRINK, Marinus, Aart
分类号 G03F7/20;B23K26/14;H01S3/03;H01S3/036;H01S3/04;H01S3/041;H01S3/097;H01S3/134;H01S3/223 主分类号 G03F7/20
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