发明名称 SEMICONDUCTOR DEVICE, DYNAMIC QUANTITY MEASURING DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 This semiconductor device is provided with: a metal body; a bonding layer arranged on the metal body; and a semiconductor chip arranged on the bonding layer. The bonding layer comprises: a first layer that is formed between the metal body and the semiconductor chip and contains a filler; and a second layer that is bonded to the first layer and the semiconductor chip and has a higher thermal expansion coefficient than the first layer.
申请公布号 WO2017006840(A1) 申请公布日期 2017.01.12
申请号 WO2016JP69521 申请日期 2016.06.30
申请人 HITACHI AUTOMOTIVE SYSTEMS, LTD. 发明人 SHIMOKAWA, Hanae;ISHIHARA, Shosaku;SOMA, Atsuo;ONOZUKA, Junji;ONUKI, Hiroshi;TERADA, Daisuke;SHIBATA, Mizuki
分类号 G01L9/00;G01B7/16;H01L29/84 主分类号 G01L9/00
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