发明名称 FAULT DIAGNOSIS CIRCUIT AND FAULT DIAGNOSIS METHOD
摘要 Provided is a fault diagnosis circuit for diagnosing an open-circuit fault in a reverse connection protection transistor, the fault diagnosis circuit being provided with: a power feed part including a switching transistor placed in an on state or an off state in response to a control signal applied to a control terminal, the switching transistor being electrically connected to each of a power source and a reverse connection protection transistor, and electrical power being fed from the power source to the reverse connection protection transistor when the switching transistor is in the on state; a power feed control part for outputting a control signal to the switching transistor and thereby controlling power feeding and stopping of power feeding to the reverse connection protection transistor; and a diagnosis part for diagnosing an open-circuit fault in the reverse connection protection transistor on the basis of the output state of the control signal and the result of detecting a voltage between the switching transistor and the reverse connection protection transistor.
申请公布号 WO2017006603(A1) 申请公布日期 2017.01.12
申请号 WO2016JP61246 申请日期 2016.04.06
申请人 KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO 发明人 MIYAZAKI, Shinichi;SUZUKI, Tatsuya
分类号 G01R31/02;H02H7/00;H02P7/00 主分类号 G01R31/02
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