发明名称 |
FAULT DIAGNOSIS CIRCUIT AND FAULT DIAGNOSIS METHOD |
摘要 |
Provided is a fault diagnosis circuit for diagnosing an open-circuit fault in a reverse connection protection transistor, the fault diagnosis circuit being provided with: a power feed part including a switching transistor placed in an on state or an off state in response to a control signal applied to a control terminal, the switching transistor being electrically connected to each of a power source and a reverse connection protection transistor, and electrical power being fed from the power source to the reverse connection protection transistor when the switching transistor is in the on state; a power feed control part for outputting a control signal to the switching transistor and thereby controlling power feeding and stopping of power feeding to the reverse connection protection transistor; and a diagnosis part for diagnosing an open-circuit fault in the reverse connection protection transistor on the basis of the output state of the control signal and the result of detecting a voltage between the switching transistor and the reverse connection protection transistor. |
申请公布号 |
WO2017006603(A1) |
申请公布日期 |
2017.01.12 |
申请号 |
WO2016JP61246 |
申请日期 |
2016.04.06 |
申请人 |
KABUSHIKI KAISHA TOKAI RIKA DENKI SEISAKUSHO |
发明人 |
MIYAZAKI, Shinichi;SUZUKI, Tatsuya |
分类号 |
G01R31/02;H02H7/00;H02P7/00 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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