发明名称 |
METHOD OF FORMING VIAS IN SILICON CARBIDE AND RESULTING DEVICES AND CIRCUITS |
摘要 |
A method of fabricating an integrated circuit on a silicon carbide substrate is disclosed that eliminates wire bonding that can otherwise cause undesired inductance. The method includes fabricating a semiconductor device including a Group III-V semiconductor layer on a surface on a silicon carbide substrate, wherein the semiconductor device defines at least one via through the silicon carbide substrate and the epitaxial layer. |
申请公布号 |
US2017012106(A1) |
申请公布日期 |
2017.01.12 |
申请号 |
US201615276332 |
申请日期 |
2016.09.26 |
申请人 |
Cree, Inc. |
发明人 |
Ring Zoltan;Sheppard Scott Thomas;Hagleitner Helmut |
分类号 |
H01L29/45;H01L21/445;H01L29/16;H01L21/308;H01L29/417;H01L29/778;H01L21/306;H01L21/768;H01L29/20 |
主分类号 |
H01L29/45 |
代理机构 |
|
代理人 |
|
主权项 |
1. A semiconductor device comprising:
a silicon carbide substrate having a first main surface and a second main surface opposing the first main surface; an active epitaxial device layer on the first main surface of the silicon carbide substrate; a dimple extending from the second main surface into the silicon carbide substrate toward the first main surface; a first electrical contact over the active epitaxial device layer; and a second electrical contact overlying the second main surface and within the dimple. |
地址 |
Durham NC US |