发明名称 TEST UNIT
摘要 A test unit according to the present invention includes: a first contact probe contacting with an electrode provided on a front surface of one of contact targets, and contacting with an electrode of the other contact target; a second contact probe contacting with an electrode provided on a back surface of the one of contact targets and contacting with an electrode of a substrate; a first probe holder including a suction holder that sucks and holds the one of contact targets, and accommodating and holding therein the first contact probes; a second probe holder accommodating and holding therein the second contact probes; and a base portion, which is layered over the first probe holder and holds the other contact target at a side thereof layered over the first probe holder; and a gap is formed between the other contact target and the first probe holder.
申请公布号 US2017010315(A1) 申请公布日期 2017.01.12
申请号 US201515117884 申请日期 2015.02.12
申请人 NHK SPRING CO., LTD. 发明人 HIRONAKA Kohei;NIDAIRA Takashi;YONEDA Tomohiro
分类号 G01R31/02;G01R1/073;H01R13/24;G01R31/28 主分类号 G01R31/02
代理机构 代理人
主权项 1. A test unit that performs testing of two contact targets, at least of one of which includes electrodes on both sides thereof, the two contact targets being substantially plate shaped and arranged in a layering direction thereof, the test unit comprising: a first contact probe that comes into contact, at one longitudinal direction end portion side thereof, with an electrode provided on a front surface of one of the contact targets, and comes into contact, at the other end portion side thereof, with an electrode of the other contact target; a second contact probe that comes into contact, at one longitudinal direction end portion side thereof, with an electrode provided on a back surface of the one of the contact targets, and comes into contact, at the other end portion side thereof, with an electrode of a substrate that outputs a signal for the testing; a first probe holder including a suction holder that sucks and holds the one of the contact targets and accommodating and holding therein a plurality of the first contact probes according to a predetermined pattern; a second probe holder accommodating and holding therein a plurality of the second contact probes according to a predetermined pattern; and a base portion that is layered over the first probe holder and holds, at a side thereof layered over the first probe holder, the other contact target, wherein a gap is formed between the other contact target and the first probe holder.
地址 Yokohama-shi JP