发明名称 |
BUILT-IN SELF-TEST FOR ADC |
摘要 |
Representative implementations of devices and techniques provide a built-in self-test (BIST) for an analog-to-digital converter (ADC). Stimuli needed to test an ADC are generated within the chip containing the ADC. Evaluation circuitry is also available on-chip. Generation and evaluation circuits and systems are based on existing circuits and/or components of the chip. |
申请公布号 |
WO2017005748(A1) |
申请公布日期 |
2017.01.12 |
申请号 |
WO2016EP65864 |
申请日期 |
2016.07.05 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
BOGNER, Peter;KALT, Andreas;MEJRI, Jaafar;PERNULL, Martin |
分类号 |
H03M1/10;H03M1/12;H03M1/46 |
主分类号 |
H03M1/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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