发明名称 SEMICONDUCTOR ELEMENT PRODUCTION METHOD
摘要 The semiconductor element (12) production method comprises steps of: forming a plurality of semiconductor elements (12) on the main surface of a wafer (11); forming a plurality of cleaving groove groups (20), each disposed on a division reference line; and cleaving the wafer (11) along the division reference line (14) to separate each of the plurality of semiconductor elements (12) from one another. At least one of the plurality of cleaving groove groups (20) is disposed with respect to four semiconductor elements (12) adjacent to one another among the plurality of semiconductor elements (12). Each of the plurality of cleaving groove groups (20) contains a plurality of cleaving grooves (21, 22, 23) disposed on the division reference line (14). In this manner, the production yield for the semiconductor elements (12) may be improved.
申请公布号 WO2017006902(A1) 申请公布日期 2017.01.12
申请号 WO2016JP69764 申请日期 2016.07.04
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 YOSHIKAWA, Kenji;SUZUKI, Masato
分类号 H01L21/301;B28D5/00 主分类号 H01L21/301
代理机构 代理人
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