发明名称 SAMPLING LOCATION DISPLAYING APPARATUS AND SAMPLING METHOD
摘要 According to the sampling method of the aspect of the present invention, the coordinate (location information) of the sampling location on the sampling specimen is generated randomly by the controller, such as a personal computer, of the sampling location display. Based on the location information, the sampling location is displayed on the sampling specimen, which is a part of the recycled raw material, by laser light. Because of this, arbitrariness, in which the operator artificially selects the sampling location, during incremental sampling for setting the average quality of the sampling specimen, such as the average content of valuable metal, can be excluded reliably.
申请公布号 US2017010190(A1) 申请公布日期 2017.01.12
申请号 US201415119243 申请日期 2014.06.16
申请人 MITSUBISHI MATERIALS CORPORATION 发明人 Nitta Akira;Onishi Michiaki;Tomioka Kenichi;Tsutsui Tomohiro;Takagi Makoto
分类号 G01N1/28;H04N9/31;H04N7/18 主分类号 G01N1/28
代理机构 代理人
主权项 1. A sampling location displaying apparatus that displays a sampling location on a sample comprising: a laser irradiation part that sends a laser light irradiation toward a sample spread on a sampling field and displays a sampling location mark in a predetermined shape on the sample; and a controller that controls the laser irradiation part.
地址 Tokyo JP