发明名称 Devices And Methods For Feedthrough Leakage Current Detection And Decontamination In Ionization Gauges
摘要 Devices and corresponding methods can be provided to test an ionization gauge, such as a hot cathode ionization gauge, for leakage currents and to respond to the leakage currents to improve pressure measurement accuracy. Responding to the leakage current can include applying a correction to a pressure measurement signal generated by the gauge based on the leakage current. Responding to the leakage current can also include removing contamination causing the leakage current, where the contamination is on electrical feedthrough insulators or other gauge surfaces. Testing and correcting for leakage currents and removing contamination can be completed with the ionization pressure gauge in situ in its environment of use, and while the gauge remains under vacuum.
申请公布号 US2017010171(A1) 申请公布日期 2017.01.12
申请号 US201514795706 申请日期 2015.07.09
申请人 MKS Instruments, Inc. 发明人 Blouch Stephen C.;Arnold Paul C.;Brucker Gerardo A.;Graba Wesley J.;Hansen Douglas C.
分类号 G01L21/32 主分类号 G01L21/32
代理机构 代理人
主权项 1. A device comprising: an ionization gauge in which ions are generated by electron flow between a cathode and an anode; and an electrical circuit coupled to the ionization gauge and configured to test the ionization gauge under vacuum in situ for leakage current and to respond to the leakage current to improve pressure measurement accuracy.
地址 Andover MA US