发明名称 状態監視装置
摘要 The present invention relates to a condition monitoring apparatus for monitoring a machine condition. According to the present invention, the diagnosis accuracy can be improved as reducing dependence on technical knowledge about the machine. The condition monitoring apparatus that diagnosis an abnormal state of a machine based on machine operation data acquired from a plurality of sensors. The condition monitoring apparatus includes a data collection unit configured to collect a plurality pieces of sensor data of the machine, a diagnosing unit configured to acquire a sensor data group at a predetermined time from the sensor data and a data storage unit that stores a diagnostic model that is a requirement to diagnose an abnormal state of the machine, and diagnose the abnormal state of the diagnosed machine based on the diagnostic model, a first distribution creation unit configured to create first distribution that is data frequency of each sensor based on the sensor data group aggregated with the total number of bins or a width which is previously set according to the machine performance, a second distribution creation unit configured to extract sensor data from the sensor data group at a time when the diagnosing unit diagnoses the abnormal state and create second distribution that is frequency of extracted data of each sensor aggregated with the total number of bins or width which is same as that of the first distribution, a display unit configured to display, on a screen, the first distribution and the second distribution of each sensor, an input unit to which a user inputs a new diagnostic model, and an update unit configured to write the new diagnostic model to the data storage unit.
申请公布号 JP6060261(B2) 申请公布日期 2017.01.11
申请号 JP20150523670 申请日期 2013.06.24
申请人 株式会社日立製作所 发明人 蛭田 智昭;鈴木 英明;藤原 淳輔;内田 貴之
分类号 G05B23/02 主分类号 G05B23/02
代理机构 代理人
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