发明名称 ウエハ研磨装置
摘要 A wafer polishing apparatus includes a lower surface plate, an upper surface plate disposed over the lower surface plate, a carrier disposed between the lower surface plate and the upper surface plate and containing a wafer, and a lift unit lifting the carrier such that an upper surface of the carrier contacts a lower surface of the upper surface plate or lowering the carrier such that a lower surface of the carrier contacts an upper surface of the lower surface plate.
申请公布号 JP6059305(B2) 申请公布日期 2017.01.11
申请号 JP20150151599 申请日期 2015.07.31
申请人 エルジー・シルトロン・インコーポレーテッド 发明人 キー・ユン・ハン
分类号 B24B37/005 主分类号 B24B37/005
代理机构 代理人
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