发明名称 高精度非接触位置測定機構を持つサブミリ波近傍界測定装置
摘要 PROBLEM TO BE SOLVED: To provide a system and a method for measuring the distribution of electromagnetic intensities of sub-millimeter wave beams without being affected by errors ensuing from the setup of optical constituent elements and moreover in a non-contact way.SOLUTION: Three or more collimated light reflectors are arranged in a sub-millimeter wave beam receiver, and any misalignment between a transmission system and a receiver optical system is determined on the basis of the receiving positions of collimated light beams transmitted from a collimator and reflected by the reflectors; a distribution of electromagnetic intensities of sub-millimeter wave beams received by the receiver optical system, cleared of any influence of misalignment, is determined by correction using the misalignment.
申请公布号 JP6056022(B2) 申请公布日期 2017.01.11
申请号 JP20150076438 申请日期 2015.04.03
申请人 国立研究開発法人宇宙航空研究開発機構 发明人 西堀 俊幸
分类号 G01R29/08 主分类号 G01R29/08
代理机构 代理人
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