发明名称 光学測定用プローブ及びこれを備えた光学測定装置
摘要 There are provided an optical measurement probe capable of obtaining a more stable measurement result, and an optical measurement device provided with the same. An incidence surface of an optical window to be used in a high temperature environment is covered by a deposited film. The optical window is formed of sapphire, and the deposited film is formed from SiO2. Adhesion of dirt to the incidence surface, and an influence, on a measurement result, of the adhesion of dirt on the incidence surface can thereby be prevented, and a more stable measurement result can be obtained.
申请公布号 JP6059625(B2) 申请公布日期 2017.01.11
申请号 JP20130195553 申请日期 2013.09.20
申请人 株式会社島津製作所;本田技研工業株式会社 发明人 永井 徹也;岩井 信之;古川 泰之;平岡 亮二;東垣外 功;岡田 暁
分类号 G01M15/02;F02P17/12;G01J1/02 主分类号 G01M15/02
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