发明名称 酸化物半導体膜の評価方法
摘要 Experience shows that, in a material containing oxygen as a main component, an excess or deficiency of trace amounts of oxygen with respect to a stoichiometric composition, or the like affects properties of the material. An oxygen diffusion evaluation method of an oxide film stacked body includes the steps of: measuring a quantitative value of one of oxygen isotopes of a substrate including a first oxide film and a second oxide film which has an existence proportion of an oxygen isotope different from an existence proportion of an oxygen isotope in the first oxide film in a depth direction, by secondary ion mass spectrometry; and evaluating the one of the oxygen isotopes diffused from the first oxide film to the second oxide film.
申请公布号 JP6060238(B2) 申请公布日期 2017.01.11
申请号 JP20150205744 申请日期 2015.10.19
申请人 株式会社半導体エネルギー研究所 发明人 岡崎 豊;今井 馨太郎;磯部 敦生;山崎 舜平
分类号 H01L21/336;G01N27/62;H01L29/786 主分类号 H01L21/336
代理机构 代理人
主权项
地址