发明名称 両面研磨装置用キャリアの製造方法及び両面研磨方法
摘要 A manufacturing method of a carrier for a double-side polishing apparatus by performing a lapping process on the carrier for a double-side polishing apparatus, being gear shaped and having a holding hole to hold a semiconductor wafer; including: providing an outer carrier, being larger than the carrier for a double-side polishing apparatus in size, having a hole to hold the carrier for a double-side polishing apparatus, and being configured to arrange the center of the hole to be eccentric to the center of the outer carrier; holding the carrier for a double-side polishing apparatus by the outer carrier, with the carrier for a double-side polishing apparatus being put in the hole; and performing a lapping process on the carrier for a double-side polishing apparatus with the center of the hole being eccentric to the center of the outer carrier.
申请公布号 JP6056793(B2) 申请公布日期 2017.01.11
申请号 JP20140051332 申请日期 2014.03.14
申请人 信越半導体株式会社 发明人 佐藤 一弥;田中 佑宜;小林 修一
分类号 B24B37/28;B24B37/08;H01L21/304 主分类号 B24B37/28
代理机构 代理人
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