| 摘要 |
A method for measuring a quality parameter, such as luminance uniformity, of a video display, according to some embodiments of the present invention, includes providing a plurality of pattern images to be displayed sequentially on the video display, measuring the amount of light produced by each pattern image using a wide-angle light sensor, and calculating the video display quality parameter using the measured light values corresponding to each displayed pattern. Each pattern used in accordance with this method is derived from an orthogonal matrix, resulting in each pattern having a high average brightness, thereby eliminating the need to use a narrow-angle, spot light meter, and instead allowing measurements to be made using a simple, wide-angle, incident-light or reflected-light photometer. This method is compliant with the relevant SMPTE measurement standard for measuring luminance uniformity. Additionally, some embodiments of the present invention provide an apparatus for practicing this method. |
