发明名称 |
High voltage LDMOS device with an increased voltage at source (high side) and a fabricating method thereof |
摘要 |
A high voltage LDMOS device having high side source voltage, an n type buried layer and a p type buried layer situated on the interface between a p type substrate and an n type epitaxial layer; a lateral surface of the n type buried layer and a lateral surface of the p type buried layer not in contact, and are distant from one another with a distance, thereby increasing the withstand voltage between the n type buried layer and the p type buried layer; the p type buried layer and the drain overlap at least partially in a vertical direction, enabling the p type buried layer to exert a reduced surface field action on the drain, to increase the withstand voltage of the drain against the source; the source and the body terminal centrally on top of the n type buried layer. |
申请公布号 |
US9543432(B2) |
申请公布日期 |
2017.01.10 |
申请号 |
US201514982682 |
申请日期 |
2015.12.29 |
申请人 |
Shanghai Huahong Grace Semiconductor Manufacturing Corporation |
发明人 |
Yue Wei;Xing Junjun;Yang Wenqing |
分类号 |
H01L29/00;H01L29/78;H01L29/06;H01L29/10;H01L21/265;H01L21/324;H01L29/66 |
主分类号 |
H01L29/00 |
代理机构 |
MKG, LLC |
代理人 |
MKG, LLC |
主权项 |
1. A high voltage LDMOS device with a high side source voltage, the LDMOS device comprises:
a bowl shaped isolating ring surrounding the LDMOS device;the isolating ring comprises an n type buried layer and a p type buried layer along an interface between a p type substrate and an n type epitaxial layer, and a p well on top of the p type buried layer;
a lateral surface of the n type buried layer and a lateral surface of the p type buried layer are not in contact with one another, and are distant from one another with a distance, thereby withstanding an increased voltage between the n type buried layer and the p type buried layer; the p type buried layer and a drain overlap at least partially in a vertical direction, thus enabling the p type buried layer to exert a reduced surface field action on the drain, so as to withstand an increased voltage of the drain against a source; and the n type buried layer is in the center bottom of the source and a body terminal, so that the source and the body terminal are high voltage isolated from the p type substrate. |
地址 |
Shanghai CN |