Ultrasonic probe for examining an object with ultrasound and corresponding examination method

摘要

An ultrasonic probe for examining an object with ultrasound and a corresponding examination method are provided. The probe includes a plurality of emitter elements able to emit ultrasonic waves for emitting a focused ultrasonic beam into the object through an active area of a surface of the object, and a profilometer for determining the profile of the surface of the object and for controlling the emission of the ultrasonic beam depending on the determined profile. The profilometer includes an image-taking apparatus for taking at least one digital image of the active area and an image processing module able to determine the profile of the active area by analyzing the optical blurring of the or at least one image.

主权项

1. An ultrasonic probe for examining an object with ultrasound, the probe comprising:
a plurality of emitter elements configured to emit ultrasonic waves for emitting a focused ultrasonic beam into the object through an active area of a surface of the object; a profilometer configured for determining the profile of the surface of the object and for controlling the emission of the ultrasonic beam depending on the determined profile, the profilometer including an image-taking apparatus configured for taking at least one digital image of the active area and an image processing module able to determine the profile of the active area by analyzing an optical blurring of the at least one image.