发明名称 |
Lithographic apparatus and device manufacturing method involving a sensor detecting a radiation beam through liquid |
摘要 |
A lithographic projection apparatus and device manufacturing method is disclosed in which a space between a projection system and an object on a substrate table, is at least partly filled with a liquid. A sensor is positioned to be illuminated by a beam of radiation once it has passed through the liquid. An edge seal member may be provided to at least partly surround an edge of the sensor and to provide a primary surface facing the projection system substantially co-planar with a primary surface of the sensor. |
申请公布号 |
US9541843(B2) |
申请公布日期 |
2017.01.10 |
申请号 |
US201113306532 |
申请日期 |
2011.11.29 |
申请人 |
ASML NETHERLANDS B.V. |
发明人 |
Lof Joeri;Bijlaart Erik Theodorus Maria;Ritsema Roelof Aeilko Siebrand;Van Schaik Frank;Sengers Timotheus Franciscus;Simon Klaus;De Smit Joannes Theodoor;Den Boef Arie Jeffrey Maria;Butler Hans;Donders Sjoerd Nicolaas Lambertus;Hoogendam Christiaan Alexander;Van De Kerkhof Marcus Adrianus;Kolesnychenko Aleksey Yurievich;Kroon Mark;Ottens Joost Jeroen;Loopstra Erik Roelof;Meijer Hendricus Johannes Maria;Mertens Jeroen Johannes Sophia Maria;Mulkens Johannes Catharinus Hubertus;Straaijer Alexander;Streefkerk Bob;Van Santen Helmar |
分类号 |
G03B27/52;G03F7/20 |
主分类号 |
G03B27/52 |
代理机构 |
Pillsbury Winthrop Shaw Pittman LLP |
代理人 |
Pillsbury Winthrop Shaw Pittman LLP |
主权项 |
1. A lithographic projection apparatus comprising:
a substrate table configured to hold a substrate; a projection system adapted to project a patterned beam onto a target portion of the substrate; a liquid supply system configured to at least partly fill a space between the projection system and an object on the substrate table, with a liquid; a part of a sensor system, the sensor system part capable of being positioned to be illuminated by a beam of radiation; an edge member, other than the substrate, configured to at least partly extend along an edge of the sensor system part and to provide a primary surface facing the projection system substantially co-planar with a primary surface of the sensor system part; and a low pressure exhaust orifice terminating an end of a low pressure exhaust passage, the low pressure exhaust orifice located underneath at least part of the edge member and defined in an upwardly facing surface. |
地址 |
Veldhoven NL |