发明名称 High mobility devices and methods of forming same
摘要 An embodiment method includes forming a first fin and a second fin over a semiconductor substrate. The first fin includes a first semiconductor strip of a first type, and the second fin includes a second semiconductor strip of the first type. The method further includes replacing the second semiconductor strip with a third semiconductor strip of a second type different than the first type. Replacing the second semiconductor strip includes masking the first fin using a barrier layer while replacing the second semiconductor strip and performing a chemical mechanical polish (CMP) on the third semiconductor strip using a slurry that planarizes the third semiconductor strip at a faster rate than the barrier layer. In some embodiments, the method may further include depositing a sacrificial layer over a wafer containing the first and second fins and performing a non-selective CMP to substantially level a top surface of the wafer.
申请公布号 US9543417(B2) 申请公布日期 2017.01.10
申请号 US201414536119 申请日期 2014.11.07
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Su Huan-Chieh;Chen Cheng-Long;Jiang Ching-Hong;Wann Clement Hsingjen
分类号 H01L21/8234;H01L29/66 主分类号 H01L21/8234
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A method for forming a fin field effect transistor (finFET) comprising: forming a first fin over a semiconductor substrate, the first fin comprising a first semiconductor strip of a first type; forming a second fin over the semiconductor substrate, the second fin comprising a second semiconductor strip of the first type; and replacing the second semiconductor strip with a third semiconductor strip of a second type different than the first type, wherein replacing the second semiconductor strip comprises: masking the first fin using a barrier layer while replacing the second semiconductor strip; andperforming a chemical mechanical polish (CMP) on the third semiconductor strip using a slurry that planarizes the third semiconductor strip at a faster rate than the barrier layer; and forming one or more shallow trench isolation (STI) regions between the first fin and the second fin, wherein masking the first fin further comprises masking a first portion of the one or more STI regions and exposing a second portion of the one or more STI regions.
地址 Hsin-Chu TW