发明名称 Semiconductor device
摘要 A semiconductor device which is capable of operating at an operation frequency “f”, includes a substrate, a first element unit and a second element unit. The substrate has a thermal diffusion coefficient “D”. The first element unit is formed on the substrate. The first element includes a first active element. The second element unit is adjacent to the first element unit on the substrate. The second element includes a second active element. The second active element acts on a different timing from the first active element. Moreover, a distance of between a first gravity center of the first element unit and a second gravity center of the second element unit is equal to or less than twice of a thermal diffusion length (D/πf)1/2.
申请公布号 US9543286(B2) 申请公布日期 2017.01.10
申请号 US201012728901 申请日期 2010.03.22
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 Kuraguchi Masahiko
分类号 H01L27/105;H01L27/02;H01L27/06;H01L29/417;H01L29/778;H01L29/872;H01L21/82;H01L29/16;H01L29/20;H01L29/423 主分类号 H01L27/105
代理机构 Amin, Turocy & Watson LLP 代理人 Amin, Turocy & Watson LLP
主权项 1. A wide-gap semiconductor device, the device comprising: a substrate having a thermal diffusion coefficient “D”; a plurality of first element units formed on the substrate, the first element units each including a first active element; and a plurality of second element units, the second element units each including a second active element, the second active element acting on a different timing from the first active element each of the first element units and each of the second element units being arranged alternately, wherein a distance of between a first gravity center of the first element unit and a second gravity center of the second element unit is equal to or less than twice of a thermal diffusion length (D/(πf))1/2, excluding zero, so that the first element units and the second element units are spatially separated from each other, and wherein any two of the first element units do not share a first electrode or a second electrode with each other, and wherein any two of the second element units do not share the first electrode or the second electrode with each other, and wherein the first electrode and the second electrode are included in each of the first element units and each of the second element units, and wherein the thermal diffusion length being within a range when the semiconductor operates at a frequency “f’, and the frequency “f’ being between 10 kHz and 1 MHz, and wherein the first active element units are transistors and the second active elements are diodes.
地址 Tokyo JP