发明名称 Method for curing flowable layer
摘要 Methods for forming a semiconductor structure are provided. The method for forming a semiconductor structure includes forming a flowable layer over a substrate and heating the flowable layer to form a cured layer in a curing process. In addition, the curing process is performed under a pressure of over 2 atmospheres, and the flowable layer reacts with precursors in the flowable layer during the curing process.
申请公布号 US9543141(B2) 申请公布日期 2017.01.10
申请号 US201414564304 申请日期 2014.12.09
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 Liao Chi-Ming;Liao Ker-Hsun;Liu Chun-Ou;Lin Su-Horng
分类号 H01L21/02;H01L21/3105 主分类号 H01L21/02
代理机构 McClure, Qualey & Rodack, LLP 代理人 McClure, Qualey & Rodack, LLP
主权项 1. A method for forming a semiconductor structure, comprising: forming a flowable layer over a substrate; driving precursors into the flowable layer before a curing process under a pressure of over 2 atmospheres, wherein the flowable layer has a top portion and a bottom portion and the bottom portion is disposed between the top portion and the substrate such that the precursors enter and react with the top portion and with the bottom portion, wherein the precursors comprise O2, H2O, H2O2, O3 or a combination thereof; and heating the flowable layer to form a cured layer in the curing process, wherein the curing process is performed under a pressure of over 2 atmospheres, the flowable layer reacts with the precursors in the flowable layer during the curing process, and after the cured layer is formed, no heating process is performed to the cured layer.
地址 Hsin-Chu TW