发明名称 |
Ionic thermal acid generators for low temperature applications |
摘要 |
New ionic thermal acid generator compounds are provided. Also provided are photoresist compositions, antireflective coating compositions, and chemical trim overcoat compositions, and methods of using the compositions. |
申请公布号 |
US9541834(B2) |
申请公布日期 |
2017.01.10 |
申请号 |
US201213691689 |
申请日期 |
2012.11.30 |
申请人 |
Rohm and Haas Electronic Materials LLC |
发明人 |
Pohlers Gerhard;Liu Cong;Xu Cheng-Bai;Rowell Kevin;Kaur Irvinder |
分类号 |
G03F7/40;G03F7/30;G03F7/09;G03F7/11;G03F7/039;C07D239/26;C07D241/12;C07D263/32;C07D277/22;C07C309/03;C07C309/06;C07D333/48 |
主分类号 |
G03F7/40 |
代理机构 |
Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. |
代理人 |
Mintz Levin Cohn Ferris Glovsky and Popeo, P.C. ;Corless Peter F. |
主权项 |
1. A method for providing a photoresist relief image, comprising:
a) applying a coating layer of a chemically amplified photoresist composition on a substrate; b) exposing the photoresist layer to activating radiation and developing the exposed photoresist layer to provide a photoresist relief image; c) applying over the exposed photoresist composition coating layer a coating layer of a chemical trim overcoat composition comprising a thermal acid generator of formula (I);
(A−)(BH)+ (I) in which A− is the anion of an organic or inorganic acid having a pKa of not more than 3; and (BH)+ is the monoprotonated form of a nitrogen-containing base B having a pKa between 0 and 5.0, and a boiling point less than 170° C.; d) heating the chemical trim overcoat composition layer; and e) developing the photoresist layer to provide a photoresist relief image. |
地址 |
Marlborough MA US |