发明名称 Semiconductor device and manufacturing method thereof, delamination method, and transferring method
摘要 A substrate and a delamination film are separated by a physical means, or a mechanical means in a state where a metal film formed over a substrate, and a delamination layer comprising an oxide film including the metal and a film comprising silicon, which is formed over the metal film, are provided. Specifically, a TFT obtained by forming an oxide layer including the metal over a metal film; crystallizing the oxide layer by heat treatment; and performing delamination in a layer of the oxide layer or at both of the interface of the oxide layer is formed.
申请公布号 US9543337(B2) 申请公布日期 2017.01.10
申请号 US201514961043 申请日期 2015.12.07
申请人 Semiconductor Energy Laboratory Co., Ltd. 发明人 Maruyama Junya;Takayama Toru;Ohno Yumiko;Yamazaki Shunpei
分类号 H01L27/12;H01L29/786 主分类号 H01L27/12
代理机构 Robinson Intellectual Property Law Office 代理人 Robinson Intellectual Property Law Office ;Robinson Eric J.
主权项 1. A method for manufacturing a display device comprising the steps of: forming a metal film comprising a metal over a first substrate; forming a first insulating film comprising oxygen over the metal film, wherein an oxide layer comprising the metal is formed by oxidation at an interface between the metal film and the first insulating film; forming a semiconductor element over the first insulating film; forming a second substrate over the semiconductor element; and separating the semiconductor element adhered to the second substrate from the first substrate.
地址 Kanagawa-ken JP