发明名称 |
MULTI-LAYERED CONTACT TO SEMICONDUCTOR STRUCTURE |
摘要 |
A multi-layered contact to a semiconductor structure and a method of making is described. In one embodiment, the contact includes a discontinuous Chromium layer formed over the semiconductor structure. A discontinuous Titanium layer is formed directly on the Chromium layer, wherein portions of the Titanium layer extend into at least some of the discontinuous sections of the Chromium layer. A discontinuous Aluminum layer is formed directly on the Chromium layer, wherein portions of the Aluminum layer extend into at least some of the discontinuous sections of the Titanium layer and the Chromium layer. |
申请公布号 |
WO2017004365(A1) |
申请公布日期 |
2017.01.05 |
申请号 |
WO2016US40375 |
申请日期 |
2016.06.30 |
申请人 |
SENSOR ELECTRONIC TECHNOLOGY, INC. |
发明人 |
SHUR, Michael;DOBRINSKY, Alexander |
分类号 |
H01L27/15;H01L33/36 |
主分类号 |
H01L27/15 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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