发明名称 SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF
摘要 A semiconductor device includes first fin-shaped structures and second fin-shaped structures, which are separately disposed on a semiconductor substrate. Each of the first and second fin-shaped structures includes a base portion and a top portion protruding from the top portion. The base portions of the second fin-shaped structures are wider than the top portions of the second fin-shaped structures, and the top portions of the second fin-shaped structures are as wide as the top portions of the first fin-shaped structures. Each second fin-shaped structure further includes a recessed region on its sidewall.
申请公布号 US2017005181(A1) 申请公布日期 2017.01.05
申请号 US201514820565 申请日期 2015.08.07
申请人 United Microelectronics Corp. 发明人 Liou En-Chiuan;Tung Yu-Cheng
分类号 H01L29/66;H01L29/06;H01L21/283;H01L21/308;H01L21/31;H01L21/762;H01L29/78;H01L29/10 主分类号 H01L29/66
代理机构 代理人
主权项 1. A semiconductor device, comprising: a plurality of first fin-shaped structures disposed on a semiconductor substrate, wherein each of the first fin-shaped structures comprises: a base portion disposed on the semiconductor substrate; and a top portion extending from the base portion of the first fin-shaped structure, wherein the top portion of each of the first fin-shaped structure has a first width; a plurality of second fin-shaped structures disposed on the semiconductor substrate, wherein each of the second fin-shaped structures comprises: a base portion disposed on the semiconductor substrate; and a top portion extending from the base portion of the second fin-shaped structure, wherein the top portion of each of the second fin-shaped structure has the first width; and a recessed region disposed on a sidewall of each of the second fin-shaped structures; and a shallow trench isolation disposed between the first fin-shaped structures and the second fin-shaped structures so that portions of each of the top portions protrude from the surface of the shallow trench isolation, wherein the base portions of the second fin-shaped structures are separately disposed on the semiconductor substrate.
地址 Hsin-Chu City TW