发明名称 |
SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF |
摘要 |
A semiconductor device includes first fin-shaped structures and second fin-shaped structures, which are separately disposed on a semiconductor substrate. Each of the first and second fin-shaped structures includes a base portion and a top portion protruding from the top portion. The base portions of the second fin-shaped structures are wider than the top portions of the second fin-shaped structures, and the top portions of the second fin-shaped structures are as wide as the top portions of the first fin-shaped structures. Each second fin-shaped structure further includes a recessed region on its sidewall. |
申请公布号 |
US2017005181(A1) |
申请公布日期 |
2017.01.05 |
申请号 |
US201514820565 |
申请日期 |
2015.08.07 |
申请人 |
United Microelectronics Corp. |
发明人 |
Liou En-Chiuan;Tung Yu-Cheng |
分类号 |
H01L29/66;H01L29/06;H01L21/283;H01L21/308;H01L21/31;H01L21/762;H01L29/78;H01L29/10 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a plurality of first fin-shaped structures disposed on a semiconductor substrate, wherein each of the first fin-shaped structures comprises: a base portion disposed on the semiconductor substrate; and a top portion extending from the base portion of the first fin-shaped structure, wherein the top portion of each of the first fin-shaped structure has a first width; a plurality of second fin-shaped structures disposed on the semiconductor substrate, wherein each of the second fin-shaped structures comprises: a base portion disposed on the semiconductor substrate; and a top portion extending from the base portion of the second fin-shaped structure, wherein the top portion of each of the second fin-shaped structure has the first width; and a recessed region disposed on a sidewall of each of the second fin-shaped structures; and a shallow trench isolation disposed between the first fin-shaped structures and the second fin-shaped structures so that portions of each of the top portions protrude from the surface of the shallow trench isolation, wherein the base portions of the second fin-shaped structures are separately disposed on the semiconductor substrate. |
地址 |
Hsin-Chu City TW |