发明名称 |
SANDWICH EPI CHANNEL FOR DEVICE ENHANCEMENT |
摘要 |
The present disclosure relates to a transistor device having a channel region comprising a sandwich film stack with a plurality of different layers that improve device performance, and an associated apparatus. In some embodiments, the transistor device has a source region and a drain region disposed within a semiconductor substrate. A sandwich film stack is laterally positioned between the source region and the drain region. The sandwich film stack has a lower layer, a middle layer of a carbon doped semiconductor material disposed over the lower layer, and an upper layer disposed over the middle layer. A gate structure is disposed over the sandwich film stack. The gate structure is configured to control a flow of charge carriers in a channel region located between the source region and the drain region. |
申请公布号 |
US2017005095(A1) |
申请公布日期 |
2017.01.05 |
申请号 |
US201615267328 |
申请日期 |
2016.09.16 |
申请人 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
发明人 |
Hsiao Ru-Shang;Wang Ling-Sung;Huang Chih-Mu;Chan Cing-Yao;Wang Chun-Ying;Wang Jen-Pan |
分类号 |
H01L27/092;H01L29/165;H01L29/10;H01L21/306;H01L21/02;H01L21/8238;H01L29/66;H01L29/16;H01L29/06 |
主分类号 |
H01L27/092 |
代理机构 |
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代理人 |
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主权项 |
1. A transistor device, comprising:
a source region and a drain region disposed within a semiconductor substrate; a sandwich film stack laterally positioned between the source region and the drain region, wherein the sandwich film stack comprises a lower layer, a middle layer of a carbon doped semiconductor material disposed over the lower layer, and an upper layer disposed over the middle layer; and a gate structure disposed over the sandwich film stack, wherein the gate structure is configured to control a flow of charge carriers in a channel region located between the source region and the drain region. |
地址 |
Hsin-Chu TW |