发明名称 SANDWICH EPI CHANNEL FOR DEVICE ENHANCEMENT
摘要 The present disclosure relates to a transistor device having a channel region comprising a sandwich film stack with a plurality of different layers that improve device performance, and an associated apparatus. In some embodiments, the transistor device has a source region and a drain region disposed within a semiconductor substrate. A sandwich film stack is laterally positioned between the source region and the drain region. The sandwich film stack has a lower layer, a middle layer of a carbon doped semiconductor material disposed over the lower layer, and an upper layer disposed over the middle layer. A gate structure is disposed over the sandwich film stack. The gate structure is configured to control a flow of charge carriers in a channel region located between the source region and the drain region.
申请公布号 US2017005095(A1) 申请公布日期 2017.01.05
申请号 US201615267328 申请日期 2016.09.16
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Hsiao Ru-Shang;Wang Ling-Sung;Huang Chih-Mu;Chan Cing-Yao;Wang Chun-Ying;Wang Jen-Pan
分类号 H01L27/092;H01L29/165;H01L29/10;H01L21/306;H01L21/02;H01L21/8238;H01L29/66;H01L29/16;H01L29/06 主分类号 H01L27/092
代理机构 代理人
主权项 1. A transistor device, comprising: a source region and a drain region disposed within a semiconductor substrate; a sandwich film stack laterally positioned between the source region and the drain region, wherein the sandwich film stack comprises a lower layer, a middle layer of a carbon doped semiconductor material disposed over the lower layer, and an upper layer disposed over the middle layer; and a gate structure disposed over the sandwich film stack, wherein the gate structure is configured to control a flow of charge carriers in a channel region located between the source region and the drain region.
地址 Hsin-Chu TW