BALUNLESS TEST FIXTURE

摘要

A test fixture and method of its use are disclosed. The test fixture includes a test fixture frame including a first test fixture mount having a first test head mounted thereon, the first test head slidable along a first axis, and a second test fixture mount having a second test head mounted thereon that is slidable along a second axis perpendicular to the first axis. The test fixture further includes a first test plate holder mounted to the first test head and including a clamping mechanism, as well as a probe mounting plate mounted to the first test plate holder and retained by the clamping mechanism and including a plurality of radially-disposed probe receptacles. The test fixture includes a plurality of probe assemblies received in corresponding probe receptacles, each including a probe extending at least partially through the probe mounting plate, each electrically connecting to a design under test.

主权项

1. A test fixture for electrical equipment, the test fixture comprising:
a test fixture frame including:
a first test fixture mount having a first test head mounted thereon, the first test head slidable along a first axis; anda second test fixture mount having a second test head mounted thereon, the second test head slidable along a second axis perpendicular to the first axis; a first test plate holder mounted to the first test head, the first test plate holder including a clamping mechanism; a probe mounting plate mounted to the first test plate holder and retained by the clamping mechanism, the probe mounting plate including a plurality of radially-disposed probe receptacles; a plurality of probe assemblies received in corresponding probe receptacles, each of the probe assemblies including a probe extending at least partially through the probe mounting plate, each probe electrically connecting to a design under test.