发明名称 Reducing Autodoping of III-V Semiconductors By Atomic Layer Epitaxy (ALE)
摘要 In one aspect, a method for forming a doped III-V semiconductor material on a substrate includes the steps of: (a) forming a first monolayer on the substrate, wherein the first monolayer comprises at least one group III or at least one group V element; and (b) forming a doped second monolayer on a side of the first monolayer opposite the substrate, wherein the second monolayer comprises either i) at least one group V element if the first monolayer comprises at least one group III element, or ii) at least one group III element if the first monolayer comprises at least one group V element, wherein a dopant is selectively introduced only during formation of the second monolayer, and wherein steps (a) and (b) are performed using atomic layer epitaxy. Doped III-V semiconductor materials are also provided.
申请公布号 US2017004969(A1) 申请公布日期 2017.01.05
申请号 US201514755636 申请日期 2015.06.30
申请人 International Business Machines Corporation 发明人 Cohen Guy M.;Lavoie Christian
分类号 H01L21/02;C30B29/40;C30B25/14 主分类号 H01L21/02
代理机构 代理人
主权项 1. A method for forming a doped III-V semiconductor material on a substrate, the method comprising the steps of: (a) forming a first monolayer on the substrate, wherein the first monolayer comprises at least one group III or at least one group V element; (b) forming a doped second monolayer on a side of the first monolayer opposite the substrate, wherein the second monolayer comprises either i) at least one group V element if the first monolayer comprises at least one group III element, or ii) at least one group III element if the first monolayer comprises at least one group V element, wherein a dopant is selectively introduced only during formation of the second monolayer, and wherein steps (a) and (b) are performed using atomic layer epitaxy.
地址 Armonk NY US