发明名称 MEMS SENSOR DEVICES HAVING A SELF-TEST MODE
摘要 A micro-electro-mechanical system (MEMS) device comprises a micro-electro-mechanical system (MEMS) sensor; a detector circuit; a controller circuit coupled with the MEMS sensor; a first connection arranged between a first output of the MEMS sensor and a first input of the detector circuit; a second connection arranged between a second output of the MEMS sensor and a second input of the detector circuit; and a first switch arranged in the first connection. The controller circuit is configured to open the first switch during a first test mode so as to connect only a single input of the detector circuit with an output of the MEMS sensor. A further switch may be provided to connect two outputs of the MEMS sensor to a single input of the detector circuit.
申请公布号 US2017003315(A1) 申请公布日期 2017.01.05
申请号 US201514962328 申请日期 2015.12.08
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 ENJALBERT JEROME ROMAIN;KNIFFIN MARGARET LESLIE;MCNEIL ANDREW C.
分类号 G01P21/00;G01P15/125 主分类号 G01P21/00
代理机构 代理人
主权项 1. A micro-electro-mechanical system (MEMS) device comprising a MEMS sensor; a detector circuit; a controller circuit coupled with the MEMS sensor; a first connection coupled to a first output of the MEMS sensor and a first input of the detector circuit; a second connection coupled to a second output of the MEMS sensor and a second input of the detector circuit; and a first switch arranged in the first connection, and configured to be controlled by the controller circuit, wherein the controller circuit is configured to open the first switch during a first test mode so as to connect only a single input of the detector circuit with an output of the MEMS sensor.
地址 Austin TX US