发明名称 APPARATUS FOR REAL-TIME NON-CONTACT NON-DESTRUCTIVE THICKNESS MEASUREMENT USING TERAHERTZ WAVE
摘要 Provided is an apparatus for real-time non-contact non-destructive thickness measurement using a terahertz wave, and more particularly, an apparatus for real-time non-contact non-destructive thickness measurement using a terahertz wave, which is capable of measuring a thickness of a sample by irradiating a terahertz continuous wave, which is generated from a wavelength-fixed laser and a wavelength-swept laser and of which the frequency is changed at a high speed, to the sample and measuring the terahertz wave transmitting or reflected from the sample.
申请公布号 US2017003116(A1) 申请公布日期 2017.01.05
申请号 US201514936275 申请日期 2015.11.09
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 Yee Dae-Su;Yahng Ji Sang
分类号 G01B11/06 主分类号 G01B11/06
代理机构 代理人
主权项 1. An apparatus for real-time non-contact non-destructive thickness measurement using a terahertz wave, comprising: a wavelength-fixed laser generating first laser light having a first fixed wavelength λ1; a wavelength-swept laser generating second laser light having a second wavelength λ2 changed from a preset minimum wavelength to a preset maximum wavelength at a high speed for one period; a driver applying a voltage modulated at the same frequency as a wavelength sweep rate to the wavelength-swept laser to change the second wavelength from the minimum wavelength to the maximum wavelength for the one period; a coupler coupling the first laser light with the second laser light to form mixed light and splitting the mixed light into first mixed light and second mixed light; an emitter receiving the first mixed light split from the coupler to output a terahertz wave having a frequency fTHz=|f1−f2| corresponding to a difference between a frequency f1=c/λ1 (c is the speed of light in vacuum) corresponding to the first wavelength λ1 and a frequency f2=c/λ2 corresponding to the second wavelength λ2; a sample irradiated with the terahertz wave output from the emitter; a detector receiving the second mixed light split from the coupler and the terahertz wave transmitting or reflected from a sample to generate a photocurrent; a data acquisition unit converting the photocurrent into digital data to acquire and output the digital data; and a calculator generating frequency-domain data from the output digital data, performing fast Fourier transform on the frequency-domain data to generate time-domain data, and calculating a thickness of the sample on the basis of the time-domain data.
地址 Daejeon KR