发明名称 |
System and method for calibrating charge-regulating module |
摘要 |
This invention provides a system and a method for calibrating charge-regulation module in vacuum environment. Means for mounting the charge-regulation module provides motions to the charge-regulation module such that a beam spot, illuminated by the charge-regulation module, on a sample surface can be moved to a pre-determined position which is irradiated by a charged particle beam. |
申请公布号 |
US9536697(B2) |
申请公布日期 |
2017.01.03 |
申请号 |
US201514716385 |
申请日期 |
2015.05.19 |
申请人 |
HERMES MICROVISION INC. |
发明人 |
Wang Yi-Xiang;Zhang Jian;Zhao Yan |
分类号 |
G01N23/00;H01J37/02;H01J37/244;H01J37/26 |
主分类号 |
G01N23/00 |
代理机构 |
WPAT, PC |
代理人 |
WPAT, PC ;King Justin;Chiang Jonathan |
主权项 |
1. A system for calibrating a charge-regulating module, comprising:
means for mounting a Laser and providing motions to move the Laser, wherein the Laser illuminates a beam on a surface of a sample with a beam spot thereon, and regulates charges on the sample surface; a detector for receiving a reflected beam from the beam spot on the sample surface; a controller, coupled to the detector, for receiving signals from the detector, calculating a position of the beam spot, and controlling the beam spot to a pre-determined location; and a transmission, coupled to the controller, and driving the mounting means such that the beam spot is moved to the pre-determined location. |
地址 |
Hsinchu TW |