发明名称 System and method for calibrating charge-regulating module
摘要 This invention provides a system and a method for calibrating charge-regulation module in vacuum environment. Means for mounting the charge-regulation module provides motions to the charge-regulation module such that a beam spot, illuminated by the charge-regulation module, on a sample surface can be moved to a pre-determined position which is irradiated by a charged particle beam.
申请公布号 US9536697(B2) 申请公布日期 2017.01.03
申请号 US201514716385 申请日期 2015.05.19
申请人 HERMES MICROVISION INC. 发明人 Wang Yi-Xiang;Zhang Jian;Zhao Yan
分类号 G01N23/00;H01J37/02;H01J37/244;H01J37/26 主分类号 G01N23/00
代理机构 WPAT, PC 代理人 WPAT, PC ;King Justin;Chiang Jonathan
主权项 1. A system for calibrating a charge-regulating module, comprising: means for mounting a Laser and providing motions to move the Laser, wherein the Laser illuminates a beam on a surface of a sample with a beam spot thereon, and regulates charges on the sample surface; a detector for receiving a reflected beam from the beam spot on the sample surface; a controller, coupled to the detector, for receiving signals from the detector, calculating a position of the beam spot, and controlling the beam spot to a pre-determined location; and a transmission, coupled to the controller, and driving the mounting means such that the beam spot is moved to the pre-determined location.
地址 Hsinchu TW