Electronic device and method for detecting surface flaw of object

摘要

Method for detecting a surface flaw of an object using an electronic device includes requesting a detection device to control a camera unit to capture a current image of a test object placed on the detection device. The current image includes a sidewall image and a reflected image. The method obtains the current image, and detects whether the sidewall image has a surface flaw. When the sidewall image has a surface flaw, a rotation angle of the test object is determined based on the reflected image. The method obtains a standard sidewall image of a standard object stored in a storage device of the electronic device, based on the rotation angle, compares the sidewall image with the standard sidewall image, and determines and displays a position of the surface flaw on a sidewall of the test object based on the comparison.

主权项

1. A computer-implemented method for detecting a surface flaw of an object using an electronic device in communication with a detection device, the method comprising:
requesting the detection device to control a camera unit to capture a current image of a test object placed on a horizontal rotation platform of the detection device, wherein the current image of the test object comprises a sidewall image of sidewalls of the test object and a reflected image of the test object shown in a plane mirror of the detection device; obtaining the current image of the test object from the camera unit; detecting, at a processor of the electronic device, whether the sidewall image of the test object has a surface flaw; determining, at the processor upon detection of a surface flaw, a rotation angle of the test object based on the reflected image of the test object; obtaining a standard sidewall image of a standard object stored in a storage device of the electronic device based on the rotation angle of the test object; comparing the sidewall image of the test object with the standard sidewall image of the standard object; determining a position of the surface flaw on a sidewall of the test object based on the comparison; and displaying the position of the surface flaw on the sidewall of the test object on a display device of the electronic device.