Intermittent contact resonance atomic force microscope and process for intermittent contact resonance atomic force microscopy

摘要

An intermittent contact atomic force microscope includes: a cantilever configured to receive a contact resonance modulation; a sample disposed proximate to the cantilever; a contact resonance modulator in communication with the cantilever and configured to provide the contact resonance modulation to the cantilever; and a scan modulator in mechanical communication with the sample to provide a scan modulation to the sample. Also disclosed is a process for performing intermittent contact atomic force microscopy, the process includes: providing a dual modulation microscope including: a cantilever configured to receive a contact resonance modulation; a sample disposed proximate to the cantilever; a contact resonance modulator in communication with the cantilever and configured to provide the contact resonance modulation to the cantilever; and a scan modulator in mechanical communication with the sample to provide a scan modulation to the sample; subjecting the cantilever to the contact resonance modulation; modulating the cantilever at a contact resonance frequency; subjecting the sample to the scan modulation; and modulating the sample at a scan modulation frequency to perform intermittent contact atomic force microscopy.

主权项

1. An intermittent contact resonance atomic force microscope comprising:
a cantilever configured to receive a contact resonance modulation comprising a contact resonance frequency; a sample disposed proximate to the cantilever; a contact resonance modulator in communication with the cantilever and configured to provide the contact resonance modulation to the cantilever; and a scan modulator in communication with the sample to provide a scan modulation to the sample, the scan modulation comprising a scan modulation frequency, wherein the contact resonance frequency is independent from the scan modulation frequency.