发明名称 |
SOI substrate, method for manufacturing the same, and semiconductor device |
摘要 |
An SOI substrate having an SOI layer that can be used in practical applications even when a substrate with low upper temperature limit, such as a glass substrate, is used, is provided. A semiconductor device using such an SOI substrate, is provided. In bonding a single-crystal semiconductor layer to a substrate having an insulating surface or an insulating substrate, a silicon oxide film formed using organic silane as a material on one or both surfaces that are to form a bond is used. According to the present invention, a substrate with an upper temperature limit of 700° C. or lower, such as a glass substrate, can be used, and an SOI layer that is strongly bonded to the substrate can be obtained. In other words, a single-crystal semiconductor layer can be formed over a large-area substrate that is longer than one meter on each side. |
申请公布号 |
US9536774(B2) |
申请公布日期 |
2017.01.03 |
申请号 |
US201414336245 |
申请日期 |
2014.07.21 |
申请人 |
Semiconductor Energy Laboratory Co., Ltd. |
发明人 |
Ohnuma Hideto;Kakehata Tetsuya;Iikubo Yoichi |
分类号 |
H01L21/762;H01L21/84 |
主分类号 |
H01L21/762 |
代理机构 |
Robinson Intellectual Property Law Office |
代理人 |
Robinson Intellectual Property Law Office ;Robinson Eric J. |
主权项 |
1. A method for bonding a first substrate and a second substrate, comprising the steps of:
forming a first insulating film on the first substrate, the first insulating film comprising silicon nitride; forming a second insulating film on the first insulating film by chemical vapor deposition method using organic silane gas; and bonding the first substrate and the second substrate with the first insulating film and the second insulating film interposed therebetween. |
地址 |
Kanagawa-ken JP |