发明名称 Systems and methods for implementing data analysis workflows in a non-destructive testing system
摘要 A collaboration system may include a first computing device that may communicate with at least one other computing device via a computing network. The computing network may communicatively couple to a number of computing devices and the first computing device may receive inspection data acquired by one or more non-destructive testing (NDT) devices. After receiving the inspection data, the first computing device may determine at least one of a workflow for analyzing the inspection data based on the inspection data, a layout configured to display the inspection data, or a set of tools configured to analyze the inspection data. The first computing device may then implement the workflow, display the inspection data according to the layout, and/or display the set of tools. The workflow may include one or more processes that may be used to analyze the inspection data.
申请公布号 US9535809(B2) 申请公布日期 2017.01.03
申请号 US201313747464 申请日期 2013.01.22
申请人 General Electric Company 发明人 Soorianarayanan Sekhar;Domke Michael Christopher;Messinger Jason Howard;Lambdin Thomas Eldred;Theurer Charles Burton;Ward Robert Carroll;Montagna Susan;Sbihli Scott Leo
分类号 G06Q10/06;G06Q10/00;G06F11/26 主分类号 G06Q10/06
代理机构 Fletcher Yoder, P.C. 代理人 Fletcher Yoder, P.C.
主权项 1. A collaboration system, comprising: a first computing device configured to communicate with at least one other computing device via a computing network, wherein the computing network is configured to communicatively couple to a plurality of computing devices and wherein the first computing device is configured to: receive inspection data acquired by one or more non-destructive testing (NDT) devices;determine at least one of: a workflow for analyzing the inspection data based on the inspection data, wherein the workflow comprises one or more processes configured to analyze the inspection data, wherein the first computing device is configured to determine the workflow based on a type of the NDT inspection device, an NDT methodology used to acquire the inspection data, metadata associated with the inspection data, or any combination thereof,a layout configured to display the inspection data;a set of tools configured to analyze the inspection data; andimplement the workflow.
地址 Schenectady NY US