发明名称 Fault detection assembly
摘要 A fault detection assembly of an integrated circuit having a supply port, an input port and a ground port. The fault detection assembly includes a first diode connected with one end to the supply port and connected with the other end to the input port, a second diode connected with one end to the input port and connected with the other end to the ground port, at least a first fault detection transistor of MOS type. At least one of first and second diodes includes a first diode-connected MOS transistor whose gate is connected to the gate of the first fault detection transistor.
申请公布号 US9535109(B2) 申请公布日期 2017.01.03
申请号 US201514632511 申请日期 2015.02.26
申请人 EM Microelectronic-Marin SA 发明人 Plavec Lubomir;Lukes Zdenek
分类号 G01R31/26;H01L21/66;H03K19/003;H01L27/02 主分类号 G01R31/26
代理机构 Oblon, McClelland, Maier & Neustadt, L.L.P. 代理人 Oblon, McClelland, Maier & Neustadt, L.L.P.
主权项 1. A fault detection assembly of an integrated circuit having a supply port, an input port and a ground port, the fault detection assembly comprising: a first diode connected with one end to the supply port and connected with another end to the input port; a second diode connected with one end to the input port and connected with another end to the ground port; at least a first fault detection transistor of MOS type; wherein at least one of first and second diodes comprises a first diode-connected MOS transistor whose gate is connected to the gate of the first fault detection transistor, and wherein one of drain and source of the first fault detection transistor is connected to the input port and the other one of the first fault detection transistor's drain and source is connected to a first resistor connected to one of supply port and ground port.
地址 Marin CH