发明名称 Mismatch detection using replica circuit
摘要 An apparatus for detecting an operating characteristic mismatch at an output of an amplifier by using a replica circuit is presented. In one exemplary case, a detected voltage difference at the output of the two circuits is used to drive a tuning control loop to minimize an impedance mismatch at the output of the amplifier. In another exemplary case, the replica circuit is used to detect a fault in operation in a corresponding main circuit. A method for detecting a load mismatch in a main RF circuit using the replica circuit is also presented.
申请公布号 US9535110(B2) 申请公布日期 2017.01.03
申请号 US201514883321 申请日期 2015.10.14
申请人 Peregrine Semiconductor Corporation 发明人 Nobbe Dan William
分类号 H03C1/52;G01R31/28;H03H11/28;H04B1/44;H04B17/00;H03F1/22;H03F1/56;H03F3/193;H03F3/21;H01Q11/12;H03F3/72 主分类号 H03C1/52
代理机构 Jaquez Land Greenhaus LLP 代理人 Jaquez Land Greenhaus LLP ;Jaquez, Esq. Martin J.;Steinfl, Esq. Alessandro
主权项 1. An arrangement, comprising: a sensing circuit; a first radio frequency (RF) path coupled to a first terminal of the sensing circuit, the first RF path comprising a first amplifying circuit; a second RF path coupled to a second terminal of the sensing circuit, the second RF path comprising a second amplifying circuit, the second amplifying circuit being a reduced size replica of the first amplifying circuit, wherein the sensing circuit is adapted to sense a difference between an operating characteristic of the first amplifying circuit and a reference operating characteristic of the second amplifying circuit.
地址 San Diego CA US