Thermal-mechanical testing apparatus for electrically conductive specimen testing systems and method for use thereof

摘要

A thermal-mechanical testing apparatus for use with an electrically conductive specimen testing system. In one embodiment, the apparatus includes a first compression anvil assembly, a mounting frame coupled to the first compression anvil assembly, and a second compression anvil assembly positioned opposite the first compression anvil assembly and the mounting frame. The first compression anvil assembly includes a mounting plate, a first compression anvil coupled to the mounting plate, and a heating current ground system coupled to the mounting plate. The mounting frame includes a set of conductive end plates, a set of insulating connectors connecting the conductive end plates, and a plurality of mounting components coupled to the insulating connectors. The mounting components are also coupled to the mounting plate. The second compression anvil assembly includes a conductive mounting plate, a second compression anvil coupled to the conductive mounting plate, and a heating current by-pass system coupled to the conductive mounting plate and one of the conductive end plates.

主权项

1. A thermal-mechanical materials testing apparatus comprising:
a first compression anvil assembly including:
a mounting plate;a first compression anvil coupled to the mounting plate; anda heating current ground system coupled to the mounting plate; a mounting frame coupled to the first compression anvil assembly, the mounting frame including:
a set of conductive end plates for positioning a first contact surface of a test specimen adjacent the first compression anvil of the first compression anvil assembly wherein one of the set of conductive end plates is coupled to the heating current ground system;a set of insulating connectors connecting the set of conductive end plates;and a plurality of mounting components pivotally coupled to the insulating connectors, the plurality of mounting components coupled to the mounting plate of the first compression anvil assembly, wherein the set of insulating connectors is configured to rotate and align the test specimen with respect to the first compression anvil, and permit the test specimen to expand axially in response to a compression force applied from the first compression anvil assembly; and a second compression anvil assembly positioned opposite the first compression anvil assembly and the mounting frame, the second compression anvil assembly including:
a conductive mounting plate;a second compression anvil coupled to the conductive mounting plate and positioned adjacent a second contact surface of the test specimen; anda heating current by-pass system coupled to the conductive mounting plate connecting to the other of the set of conductive end plates of the mounting frame, and configured to transfer heat to the first contact surface and the second contact surface, wherein the first contact surface has a larger area than a contact area of the first compression anvil, and the second contact surface has a larger area than a contact area of the second compression anvil.