Memory subsystem I/O performance based on in-system empirical testing

摘要

A memory subsystem empirically tests performance parameters of I/O with a memory device. Based on the empirical testing, the memory subsystem can set the performance parameters specific to the system in which the memory subsystem is included. A test system performs the testing. For each of multiple different settings for multiple different I/O circuit parameters, the test system sets a value for each I/O circuit parameter, generates test traffic to stress test the memory device with the parameter value(s), and measures an operating margin for the I/O performance characteristic. The test system further executes a search function to determine values for each I/O circuit parameter at which the operating margin meets a minimum threshold and performance of at least one of the I/O circuit parameters is increased. The memory subsystem sets runtime values for the I/O circuit parameters based on the search function.

主权项

1. A method comprising:
receiving a host memory subsystem on a host hardware platform, the host memory subsystem including a memory device; establishing respective settings for each of multiple different I/O (input/output) circuit parameters for a target I/O performance characteristic for communication with the memory device by performing the following:
setting a respective value for each I/O circuit parameter;generating test traffic with a test engine embedded in the host memory subsystem to stress test the memory device; andmeasuring an operating margin for the I/O performance characteristic;repeating the setting, generating and measuring for different values of at least one of the I/O circuit parameters so that a plurality of measurements for different I/O circuit parameter settings is made;executing a search function to determine values for each I/O circuit parameter at which the operating margin meets a minimum threshold, wherein the search function extrapolates from the plurality of measurements to a worst case condition; andsetting runtime values for the I/O circuit parameters based on the execution of the search function.