发明名称 Reticle, system comprising a plurality of reticles and method for the formation thereof
摘要 A method includes providing a pre-optical proximity correction (OPC) layout of at least a portion of at least one reticle. The pre-OPC layout defines a test cell including a first test cell area having a plurality of first target features having a first pitch and a second test cell area having a plurality of second target features having a second pitch. A post-OPC layout of the portion of the reticle is formed on the basis of the pre-OPC layout. The formation of the post-OPC layout includes performing a rule-based OPC process, wherein a plurality of first reticle features for the first test cell area are provided on the basis of the plurality of first target features, and performing a model-based OPC process, wherein a plurality of second reticle features for the second test cell area are provided on the basis of the plurality of second target features.
申请公布号 US9535319(B2) 申请公布日期 2017.01.03
申请号 US201514674157 申请日期 2015.03.31
申请人 GLOBALFOUNDRIES Inc. 发明人 Ueberreiter Guido;Ning Guoxiang;Feng Jui-Hsuan;Ackmann Paul;Lim Chin Teong
分类号 G03F1/36;G03F7/30;H01L21/768 主分类号 G03F1/36
代理机构 Amerson Law Firm, PLLC 代理人 Amerson Law Firm, PLLC
主权项 1. A method, comprising: providing a pre-optical proximity correction (OPC) layout of at least a portion of at least one reticle, said pre-OPC layout comprising a test cell comprising a first test cell area and a second test cell area, said first test cell area comprising a plurality of first target features having a first pitch, said second test cell area comprising a plurality of second target features having a second pitch; forming a post-OPC layout of said at least a portion of said at least one reticle on the basis of said pre-OPC layout, the formation of said post-OPC layout comprising: performing a rule-based OPC process wherein a plurality of first reticle features for said first test cell area are provided on the basis of said plurality of first target features; andperforming a model-based OPC process wherein a plurality of second reticle features for said second test cell area are provided on the basis of said plurality of second target features.
地址 Grand Cayman KY