发明名称 |
Reticle, system comprising a plurality of reticles and method for the formation thereof |
摘要 |
A method includes providing a pre-optical proximity correction (OPC) layout of at least a portion of at least one reticle. The pre-OPC layout defines a test cell including a first test cell area having a plurality of first target features having a first pitch and a second test cell area having a plurality of second target features having a second pitch. A post-OPC layout of the portion of the reticle is formed on the basis of the pre-OPC layout. The formation of the post-OPC layout includes performing a rule-based OPC process, wherein a plurality of first reticle features for the first test cell area are provided on the basis of the plurality of first target features, and performing a model-based OPC process, wherein a plurality of second reticle features for the second test cell area are provided on the basis of the plurality of second target features. |
申请公布号 |
US9535319(B2) |
申请公布日期 |
2017.01.03 |
申请号 |
US201514674157 |
申请日期 |
2015.03.31 |
申请人 |
GLOBALFOUNDRIES Inc. |
发明人 |
Ueberreiter Guido;Ning Guoxiang;Feng Jui-Hsuan;Ackmann Paul;Lim Chin Teong |
分类号 |
G03F1/36;G03F7/30;H01L21/768 |
主分类号 |
G03F1/36 |
代理机构 |
Amerson Law Firm, PLLC |
代理人 |
Amerson Law Firm, PLLC |
主权项 |
1. A method, comprising:
providing a pre-optical proximity correction (OPC) layout of at least a portion of at least one reticle, said pre-OPC layout comprising a test cell comprising a first test cell area and a second test cell area, said first test cell area comprising a plurality of first target features having a first pitch, said second test cell area comprising a plurality of second target features having a second pitch; forming a post-OPC layout of said at least a portion of said at least one reticle on the basis of said pre-OPC layout, the formation of said post-OPC layout comprising:
performing a rule-based OPC process wherein a plurality of first reticle features for said first test cell area are provided on the basis of said plurality of first target features; andperforming a model-based OPC process wherein a plurality of second reticle features for said second test cell area are provided on the basis of said plurality of second target features. |
地址 |
Grand Cayman KY |