发明名称 |
RESISTIVE RANDOM ACCEESS MEMORY |
摘要 |
A resistive random access memory is provided. The resistive memory cell includes a substrate, a transistor on the substrate, a bottom electrode on the substrate and electrically connected to the transistor source/drain, several top electrodes on the bottom electrode, several resistance-switching layers between the top and bottom electrode, and several current limiting layers between the resistance-switching layer and top electrodes. The cell could improve the difficulty on recognizing 1/0 signal by current at high temperature environment and save the area on the substrate by generating several conductive filaments at one transistor location. |
申请公布号 |
US2016351623(A1) |
申请公布日期 |
2016.12.01 |
申请号 |
US201514726626 |
申请日期 |
2015.06.01 |
申请人 |
Winbond Electronics Corp. |
发明人 |
Chen Frederick;Wang Ping-Kun;Liao Shao-Ching |
分类号 |
H01L27/24;H01L45/00 |
主分类号 |
H01L27/24 |
代理机构 |
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代理人 |
|
主权项 |
1. A resistive random access memory, comprising:
a substrate; a transistor, disposed on the substrate; a bottom electrode, disposed on the substrate and electrically connected to a source/drain of the transistor; a plurality of top electrodes, disposed on the bottom electrode; a plurality of resistance-switching layers, respectively disposed between the bottom electrode and the plurality of top electrodes; and a plurality of current limiting layers, respectively disposed between the plurality of resistance-switching layers and the plurality of top electrodes. |
地址 |
Taichung City TW |