发明名称 RESISTIVE RANDOM ACCEESS MEMORY
摘要 A resistive random access memory is provided. The resistive memory cell includes a substrate, a transistor on the substrate, a bottom electrode on the substrate and electrically connected to the transistor source/drain, several top electrodes on the bottom electrode, several resistance-switching layers between the top and bottom electrode, and several current limiting layers between the resistance-switching layer and top electrodes. The cell could improve the difficulty on recognizing 1/0 signal by current at high temperature environment and save the area on the substrate by generating several conductive filaments at one transistor location.
申请公布号 US2016351623(A1) 申请公布日期 2016.12.01
申请号 US201514726626 申请日期 2015.06.01
申请人 Winbond Electronics Corp. 发明人 Chen Frederick;Wang Ping-Kun;Liao Shao-Ching
分类号 H01L27/24;H01L45/00 主分类号 H01L27/24
代理机构 代理人
主权项 1. A resistive random access memory, comprising: a substrate; a transistor, disposed on the substrate; a bottom electrode, disposed on the substrate and electrically connected to a source/drain of the transistor; a plurality of top electrodes, disposed on the bottom electrode; a plurality of resistance-switching layers, respectively disposed between the bottom electrode and the plurality of top electrodes; and a plurality of current limiting layers, respectively disposed between the plurality of resistance-switching layers and the plurality of top electrodes.
地址 Taichung City TW