| 摘要 |
A burn-in test method and device. The method comprises: configuring a test task, wherein the test task comprises a test content, a test requirement resource and an execution policy (S102); judging whether the test requirement resource of the test task can be satisfied by an available test resource of a current system (S104); and executing the test task, the test requirement resource of which can be satisfied by the available test resource, according to the execution policy (S106). The problem of a low burn-in test efficiency is solved, and the burn-in test efficiency is increased. |
