发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 The purpose of the invention is to provide a fine transistor. Another purpose of the invention is to provide a transistor with low parasitic capacitance. Another purpose of the invention is to provide a transistor with high frequency characteristics. Another purpose of the invention is to provide a novel transistor. Provided is a method for manufacturing a transistor, comprising a semiconductor, a first conductor, a second conductor, a third conductor, a first insulator, and a second insulator, wherein: a hard mask layer that has a fourth conductor on the second insulator and a third insulator on the fourth conductor is formed; an opening is formed on the second insulator using the hard mask layer as a mask; the hard mask layer is removed by the formation of the opening; and the first insulator and the first conductor are formed at the opening.
申请公布号 WO2016189425(A1) 申请公布日期 2016.12.01
申请号 WO2016IB52879 申请日期 2016.05.18
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 KURATA, Motomu;SASAGAWA, Shinya;TOCHIBAYASHI, Katsuaki;OKAMOTO, Satoru;SHIMOMURA, Akihisa
分类号 H01L21/336;H01L21/28;H01L21/8234;H01L21/8238;H01L21/8242;H01L21/8247;H01L27/06;H01L27/08;H01L27/088;H01L27/092;H01L27/105;H01L27/108;H01L27/115;H01L27/146;H01L29/417;H01L29/423;H01L29/49;H01L29/786;H01L29/788;H01L29/792;H01L51/50;H05B33/14 主分类号 H01L21/336
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